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Atomic Force Microscope Product List and Ranking from 12 Manufacturers, Suppliers and Companies

Last Updated： Aggregation Period:Sep 17, 2025～Oct 14, 2025
This ranking is based on the number of page views on our site.

Atomic Force Microscope Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Sep 17, 2025～Oct 14, 2025
This ranking is based on the number of page views on our site.

  1. 日本カンタム・デザイン Tokyo//Testing, Analysis and Measurement
  2. パーク・システムズ・ジャパン Tokyo//Testing, Analysis and Measurement
  3. 一般財団法人材料科学技術振興財団　MST Tokyo//Testing, Analysis and Measurement
  4. 4 アローズエンジニアリング Chiba//Testing, Analysis and Measurement
  5. 5 オックスフォード・インストゥルメンツ Tokyo//Testing, Analysis and Measurement
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Atomic Force Microscope Product ranking

Last Updated： Aggregation Period:Sep 17, 2025～Oct 14, 2025
This ranking is based on the number of page views on our site.

  1. Atomic Force Microscope (AFM) 日本カンタム・デザイン
  2. Atomic Force Microscope "AFM with Stage" アローズエンジニアリング
  3. [New Release!] Atomic Force Microscope 'Park NX7' パーク・システムズ・ジャパン
  4. Compact AFM "NaioAFM" *Demo now available 日本カンタム・デザイン
  5. 4 [Analysis Case] Surface Shape Analysis of GaN Substrates 一般財団法人材料科学技術振興財団　MST

Atomic Force Microscope Product List

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Atomic force microscope

Atomic force microscope

Supports samples up to 100mm square in measurement modes such as C-AFM, KFM, and sMIM.

In addition to functions such as conductive AFM, Kelvin probe force microscopy (KFM), and scanning microwave impedance microscopy (sMIM), it supports samples up to 4 inches. ■ Sample size: Up to 100 mm square ■ Stage travel distance: 100 mm ■ XY scanning range: 100 μm (manufacturing dimensional tolerance +/- 10%) ■ Z scanning range: 9 μm (manufacturing dimensional tolerance +/- 10%) ■ XY scanning resolution: 24-bit control – 0.06 Angstroms ■ Z scanning resolution: 24-bit control – 0.006 Angstroms ■ Noise level: Typ: <0.01 mV RMS

  • Visual Inspection Equipment

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[Application Example] Atomic Force Microscopy (AFM) Experiment

[Application Example] Atomic Force Microscopy (AFM) Experiment

The 8-channel Spectrum DigitizerNETBOX provides the high precision necessary to drive the evolution of AFM. Comes with a comprehensive catalog.

I would like to introduce an application example of Atomic Force Microscopy (AFM) experiments at the Precision Mechatronics Laboratory of Newcastle University, UK. Atomic Force Microscopy is an important tool in materials science and is used for mechanical scanning of surfaces. The forces acting between the surface atoms and the tip of the nanoscale probe are measured and calculated, achieving a resolution on the order of a fraction of a nanometer. [Overview] ■ AFM Technology ■ High-precision Multi-channel Digitizer *For more details, please feel free to contact us.

  • Other electronic parts

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Compact AFM "NaioAFM" *Demo now available

Compact AFM "NaioAFM" *Demo now available

Quick and simple measurement of surface shapes! Standard features include dust and wind shields, and vibration prevention mechanisms.

The "NaioAFM" is a compact type of atomic force microscope that balances functionality and operability, featuring essential technologies for surface shape measurement as standard, while allowing for easy setup of the device and cantilever replacement. Before scanning, necessary re-tuning, approach to the sample, and tilt correction of the sample plane are automatically performed by the software, so once the cantilever is brought close to the sample, the scan will begin. 【Features】 ■ Integrated controller, XY stage, wind shield, and vibration isolation mechanism ■ Equipped with a high-resolution top-view optical camera and side-view observation for positioning ■ Additional measurement modes can be added according to needs ■ Demonstrations can be conducted on-site at customer locations *For more details, please refer to the materials. Feel free to contact us with any inquiries. If you wish to request a demonstration, please apply through the contact form.

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  • Electron microscope

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Multifunctional Compact Atomic Force Microscope CoreAFM

Multifunctional Compact Atomic Force Microscope CoreAFM

Active vibration isolation built-in! It supports electrochemical measurements and environmental control simply by changing the stage.

"CoreAFM" is a multifunctional compact atomic force microscope that combines high performance with scalability to accommodate any type of measurement. The top-view camera makes it easy to align the measurement target, while the side-view camera allows for visual confirmation of the distance between the cantilever and the sample. Additionally, the cantilever holder can be easily attached and detached from the AFM head unit, allowing for safe cleaning or washing of just the holder. 【Features】 ■ Ready to use with immediate connection of the controller, power supply, and USB cable ■ High-resolution 24-bit ADC/DAC ■ Maximum scan range (X, Y, Z): 100μm, 100μm, 12μm ■ Z noise level: 40pm RMS value ■ Capable of supporting 32 standard measurement modes, including measurements in liquid, as well as various optional modes *For more details, please refer to the PDF document or feel free to contact us.

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  • Other microscopes

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High-speed atomic force microscope (high-speed AFM) 'MS-NEX'

High-speed atomic force microscope (high-speed AFM) 'MS-NEX'

Even those who are handling AFM for the first time can easily observe videos at the nanoscale!

The "MS-NEX" is a high-speed atomic force microscope (high-speed AFM) module system that allows for video observation of samples at the nanoscale and in real-time within a solution. It flexibly responds to requests such as "I need this function now" or "I won't use this function now." Depending on your research theme, progress, and budget, you can use a high-speed AFM that matches your current needs by combining various modules. 【Features】 ■ Capable of video observation at the nanoscale and in real-time ■ Various functions can be freely combined as needed ■ Modules can be added later ■ Equipped with various support functions ■ Easy to use even for those handling AFM for the first time *For more details, please refer to the PDF document or feel free to contact us.

  • Microscope
  • others

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Atomic Force Microscope "Handy AFM"

Atomic Force Microscope "Handy AFM"

Achieving overwhelming resolution! Measuring previously hidden minute phenomena.

The "Handy AFM" is an atomic force microscope that can be used as a substitute for SEM and high-magnification 3D optical microscopes. It is ultra-compact, measuring 15 cm in both depth and width. The scanning head can be selected from two types: high-resolution and wide-area, and can be exchanged instantly. 【Features】 ■ Probe exchange can be performed in a few seconds ■ Carbon nanotube probes can also be auto-approached ■ Optional support for a compact automatic stage and inline fully automatic machines *For more details, please download the PDF or feel free to contact us.

  • Other inspection equipment and devices
  • Other microscopes
  • Other measurement, recording and measuring instruments

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Environmentally controlled, ultra-high performance AFM/SPM Cypher ES

Environmentally controlled, ultra-high performance AFM/SPM Cypher ES

A model of the Cypher S, which boasts exceptional performance, with fully equipped enhanced environmental control features. It easily achieves temperature control, gas and liquid measurement, and flow management.

The Cypher ES AFM/SPM (Atomic Force Microscope) from Asylum Research is a model that expands the fully equipped environmental control features on the outstanding Cypher S platform. It maintains the same high resolution, speed, and stability as the Cypher S, while allowing for easy operation in controlled gas or liquid environments and harsh chemical conditions within a temperature range of 0 to 250°C. The Cypher ES is the ultimate AFM designed to meet the most demanding experimental requirements, capable of measurements even in environments that could potentially damage other AFMs. For more details, please contact us or refer to the catalog.

  • Other measurement, recording and measuring instruments
  • Microscope

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Low-cost high-performance research AFM/SPM MFP-3D Origin

Low-cost high-performance research AFM/SPM MFP-3D Origin

Achieve high performance and high quality at low cost! The most affordable atomic force microscope with Asylum quality in the low price range. It offers high performance and a wide range of features.

The MFP-3D Origin is a model that features high performance and quality unique to Asylum Research, while being competitively priced against existing low-cost AFM/SPM options. This model offers a balance of performance and price, providing "high-resolution imaging," "large sample handling," "various imaging modes," and "diverse accessories." It is the best entry-level model for starting to use AFM/SPM!

  • Microscope

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[Analysis Case] Observation of Fine Surface Morphology of Three-Dimensional Cultured Human Skin

[Analysis Case] Observation of Fine Surface Morphology of Three-Dimensional Cultured Human Skin

Visualization of nanoscale roughness on the skin surface using AFM.

In recent years, the development of alternative methods to animal testing for the efficacy and safety testing of pharmaceuticals and cosmetics has been progressing, with particular attention being paid to testing methods using three-dimensional cultured skin. In this case study, a percutaneous absorption test of a cosmetic (lotion) was conducted using three-dimensional cultured human skin, which was measured using AFM (Atomic Force Microscopy). This allows for a visual evaluation of the microstructure of the skin surface, and it is also possible to quantitatively assess the roughness of any specific area. By measuring under atmospheric conditions, it is possible to observe the samples while minimizing alterations that would occur under vacuum conditions.

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  • Contract Analysis

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[Analysis Case] Observation of Shape Changes of Polymers on a Substrate Using Liquid AFM Measurements

[Analysis Case] Observation of Shape Changes of Polymers on a Substrate Using Liquid AFM Measurements

Visualization of structural changes in samples in the atmosphere and in aqueous solutions.

Polymers are known to exhibit diverse functions by altering their composition and structure, and they are utilized in various products. In the evaluation of polymers, assessment in real environments is crucial. This time, we will introduce a case where the shape of polymers on a substrate was visualized in the atmosphere and in aqueous solution using an environmental control atomic force microscope (AFM). Additionally, by combining data analysis, we quantified the dispersion of polymer particles.

  • Contract Analysis

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[Analysis Case] AFM Analysis of Smartphone Protective Films

[Analysis Case] AFM Analysis of Smartphone Protective Films

Quantitative evaluation of the quality of sensory products is possible.

The penetration rate of smartphones is increasing year by year, and along with that, the protective films applied to their surfaces are diversifying in functionality. In this instance, we will introduce a case where two types of films (A and B) with fingerprint prevention and anti-reflection features were quantitatively evaluated in terms of roughness, simulating the sensation of touch through AFM analysis.

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  • Contract Analysis
  • LCD display

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[Analysis Case] AFM Video Observation of Temporal Changes During Heating and Cooling Processes

[Analysis Case] AFM Video Observation of Temporal Changes During Heating and Cooling Processes

Evaluate the shape change of the sample surface in situ.

Polymers can change shape depending on environmental factors such as temperature, humidity, and solvents, and by varying the environmental conditions during evaluation, we can deepen our understanding of their physical properties. In this study, we conducted heating and cooling experiments using polycaprolactone (PCL), which is known for its biodegradability. PCL has a melting point of approximately 60°C, and we continuously observed through video how it changes from a crystalline state to an amorphous state upon heating, and how it recrystallizes upon cooling. Measurement method: AFM Product fields: Biotechnology, Pharmaceuticals, Daily Goods, Food Analysis purpose: Shape evaluation For more details, please download the materials or contact us.

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  • Contract Analysis
  • Contract measurement

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[Analysis Case] Dynamic Viscoelastic Evaluation of PDMS using AFM

[Analysis Case] Dynamic Viscoelastic Evaluation of PDMS using AFM

Introduction to the evaluation of in-plane distribution of viscoelasticity and frequency dependence!

Our organization offers dynamic viscoelastic evaluation of PDMS using AFM. Dynamic Mechanical Analysis (DMA) is an effective method for investigating viscoelastic behavior, which is an important factor in the research and development of polymer materials. Additionally, by combining it with the AFM mechanism, it becomes possible to measure in-plane distribution and evaluate localized areas. This document presents a case study using AFM-DMA to map the viscoelastic modulus of PDMS (polydimethylsiloxane) and conduct frequency-dependent spectroscopy evaluation. [Measurement Method / Processing Method] ■ [AFM] Atomic Force Microscopy *For more details, please download the PDF or feel free to contact us.

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  • Contract Analysis

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Atomic Force Microscope 'LiteScope 2.0'

Atomic Force Microscope 'LiteScope 2.0'

Correlation analysis combining SEM and AFM! A deeper understanding of material surfaces.

"LiteScope 2.0" is an atomic force microscope that can be easily integrated with scanning electron microscopes. It can be easily mounted on SEMs and is immediately usable, and it can also be used as a standalone AFM. It is compatible with FIB, GIS, EDS, and other common SEM accessories. 【Features】 ■ Extension of SEM functionality ■ Highly precise correlated imaging ■ Quick and easy alignment to areas of interest ■ Elimination of sample contamination risk ■ Extension of 2D SEM images to 3D *For more details, please refer to the PDF document or feel free to contact us.

  • Electron microscope
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  • Other inspection equipment and devices

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Atomic Force Microscope "Park NX-Wafer"

Atomic Force Microscope "Park NX-Wafer"

Automatic defect inspection function, low noise, high throughput! Introducing an accurate atomic force microscope!

The "Park NX-Wafer" is an atomic force microscope that performs defect imaging and analysis fully automatically, improving productivity in defect inspection by 1,000% through AFM measurement techniques. It is a low-noise atomic force profiler for accurate and high-throughput CMP profile measurements. It measures sub-Å surface roughness with extreme accuracy, minimizing variation between chips. 【Features】 ■ Fully automated AFM solution for defect imaging and analysis ■ Up to 1,000% increase in productivity for defect review ■ Achieves accurate and high-throughput CMP measurements with a low-noise atomic force profiler ■ Extremely accurate sub-Å surface roughness measurement, minimizing variation between chip-to-chip ■ Atomic force profiler *For more details, please refer to the PDF document or feel free to contact us.

  • Other microscopes
  • Electron microscope

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