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Atomic Force Microscope Product List and Ranking from 12 Manufacturers, Suppliers and Companies | IPROS GMS

Last Updated： Aggregation Period:Feb 04, 2026～Mar 03, 2026
This ranking is based on the number of page views on our site.

Atomic Force Microscope Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Feb 04, 2026～Mar 03, 2026
This ranking is based on the number of page views on our site.

  1. パーク・システムズ・ジャパン Tokyo//Testing, Analysis and Measurement
  2. 一般財団法人材料科学技術振興財団　MST Tokyo//Testing, Analysis and Measurement
  3. 日本カンタム・デザイン Tokyo//Testing, Analysis and Measurement
  4. 4 Oxford Instruments KK Tokyo//Testing, Analysis and Measurement
  5. 5 日本レーザー Tokyo//Electronic Components and Semiconductors
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Atomic Force Microscope Product ranking

Last Updated： Aggregation Period:Feb 04, 2026～Mar 03, 2026
This ranking is based on the number of page views on our site.

  1. Atomic Force Microscope (AFM) "Park NX10" パーク・システムズ・ジャパン
  2. [Analysis Case] Observation of Shape Changes of Polymers on a Substrate Using Liquid AFM Measurements 一般財団法人材料科学技術振興財団　MST
  3. Multifunctional Compact Atomic Force Microscope CoreAFM 日本カンタム・デザイン
  4. [Proposal for the Semiconductor Field] Surface Inspection Equipment and Resist 日本カンタム・デザイン
  5. 4 Environmentally controlled, ultra-high performance AFM/SPM Cypher ES Oxford Instruments KK

Atomic Force Microscope Product List

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Atomic force microscope

Atomic force microscope

Supports samples up to 100mm square in measurement modes such as C-AFM, KFM, and sMIM.

In addition to functions such as conductive AFM, Kelvin probe force microscopy (KFM), and scanning microwave impedance microscopy (sMIM), it supports samples up to 4 inches. ■ Sample size: Up to 100 mm square ■ Stage travel distance: 100 mm ■ XY scanning range: 100 μm (manufacturing dimensional tolerance +/- 10%) ■ Z scanning range: 9 μm (manufacturing dimensional tolerance +/- 10%) ■ XY scanning resolution: 24-bit control – 0.06 Angstroms ■ Z scanning resolution: 24-bit control – 0.006 Angstroms ■ Noise level: Typ: <0.01 mV RMS

  • Visual Inspection Equipment
  • Atomic Force Microscope

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[Application Example] Atomic Force Microscopy (AFM) Experiment

[Application Example] Atomic Force Microscopy (AFM) Experiment

The 8-channel Spectrum DigitizerNETBOX provides the high precision necessary to drive the evolution of AFM. Comes with a comprehensive catalog.

I would like to introduce an application example of Atomic Force Microscopy (AFM) experiments at the Precision Mechatronics Laboratory of Newcastle University, UK. Atomic Force Microscopy is an important tool in materials science and is used for mechanical scanning of surfaces. The forces acting between the surface atoms and the tip of the nanoscale probe are measured and calculated, achieving a resolution on the order of a fraction of a nanometer. [Overview] ■ AFM Technology ■ High-precision Multi-channel Digitizer *For more details, please feel free to contact us.

  • Other electronic parts
  • Atomic Force Microscope

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Compact AFM "NaioAFM" *Demo now available

Compact AFM "NaioAFM" *Demo now available

Quick and simple measurement of surface shapes! Standard features include dust and wind shields, and vibration prevention mechanisms.

The "NaioAFM" is a compact type of atomic force microscope that balances functionality and operability, featuring essential technologies for surface shape measurement as standard, while allowing for easy setup of the device and cantilever replacement. Before scanning, necessary re-tuning, approach to the sample, and tilt correction of the sample plane are automatically performed by the software, so once the cantilever is brought close to the sample, the scan will begin. 【Features】 ■ Integrated controller, XY stage, wind shield, and vibration isolation mechanism ■ Equipped with a high-resolution top-view optical camera and side-view observation for positioning ■ Additional measurement modes can be added according to needs ■ Demonstrations can be conducted on-site at customer locations *For more details, please refer to the materials. Feel free to contact us with any inquiries. If you wish to request a demonstration, please apply through the contact form.

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  • Electron microscope
  • Atomic Force Microscope

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Multifunctional Compact Atomic Force Microscope CoreAFM

Multifunctional Compact Atomic Force Microscope CoreAFM

Active vibration isolation built-in! It supports electrochemical measurements and environmental control simply by changing the stage.

"CoreAFM" is a multifunctional compact atomic force microscope that combines high performance with scalability to accommodate any type of measurement. The top-view camera makes it easy to align the measurement target, while the side-view camera allows for visual confirmation of the distance between the cantilever and the sample. Additionally, the cantilever holder can be easily attached and detached from the AFM head unit, allowing for safe cleaning or washing of just the holder. 【Features】 ■ Ready to use with immediate connection of the controller, power supply, and USB cable ■ High-resolution 24-bit ADC/DAC ■ Maximum scan range (X, Y, Z): 100μm, 100μm, 12μm ■ Z noise level: 40pm RMS value ■ Capable of supporting 32 standard measurement modes, including measurements in liquid, as well as various optional modes *For more details, please refer to the PDF document or feel free to contact us.

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[Proposal for the Semiconductor Field] Surface Inspection Equipment and Resist

[Proposal for the Semiconductor Field] Surface Inspection Equipment and Resist

We will propose solutions in the semiconductor field, which we specialize in, tailored to our customers' needs!

In addition to our expertise in nano-order surface analysis equipment, we also propose resist solutions and maskless exposure devices for semiconductor processes.

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  • Other microscopes
  • Resist Device
  • Semiconductor inspection/test equipment
  • Atomic Force Microscope

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High-speed atomic force microscope (high-speed AFM) 'MS-NEX'

High-speed atomic force microscope (high-speed AFM) 'MS-NEX'

Even those who are handling AFM for the first time can easily observe videos at the nanoscale!

The "MS-NEX" is a high-speed atomic force microscope (high-speed AFM) module system that allows for video observation of samples at the nanoscale and in real-time within a solution. It flexibly responds to requests such as "I need this function now" or "I won't use this function now." Depending on your research theme, progress, and budget, you can use a high-speed AFM that matches your current needs by combining various modules. 【Features】 ■ Capable of video observation at the nanoscale and in real-time ■ Various functions can be freely combined as needed ■ Modules can be added later ■ Equipped with various support functions ■ Easy to use even for those handling AFM for the first time *For more details, please refer to the PDF document or feel free to contact us.

  • Microscope
  • others
  • Atomic Force Microscope

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Atomic Force Microscope "Handy AFM"

Atomic Force Microscope "Handy AFM"

Achieving overwhelming resolution! Measuring previously hidden minute phenomena.

The "Handy AFM" is an atomic force microscope that can be used as a substitute for SEM and high-magnification 3D optical microscopes. It is ultra-compact, measuring 15 cm in both depth and width. The scanning head can be selected from two types: high-resolution and wide-area, and can be exchanged instantly. 【Features】 ■ Probe exchange can be performed in a few seconds ■ Carbon nanotube probes can also be auto-approached ■ Optional support for a compact automatic stage and inline fully automatic machines *For more details, please download the PDF or feel free to contact us.

  • Other inspection equipment and devices
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Environmentally controlled, ultra-high performance AFM/SPM Cypher ES

Environmentally controlled, ultra-high performance AFM/SPM Cypher ES

A model of the Cypher S, which boasts exceptional performance, with fully equipped enhanced environmental control features. It easily achieves temperature control, gas and liquid measurement, and flow management.

The Cypher ES AFM/SPM (Atomic Force Microscope) from Asylum Research is a model that expands the fully equipped environmental control features on the outstanding Cypher S platform. It maintains the same high resolution, speed, and stability as the Cypher S, while allowing for easy operation in controlled gas or liquid environments and harsh chemical conditions within a temperature range of 0 to 250°C. The Cypher ES is the ultimate AFM designed to meet the most demanding experimental requirements, capable of measurements even in environments that could potentially damage other AFMs. For more details, please contact us or refer to the catalog.

  • Other measurement, recording and measuring instruments
  • Microscope
  • Atomic Force Microscope

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[Analysis Case] Observation of Fine Surface Morphology of Three-Dimensional Cultured Human Skin

[Analysis Case] Observation of Fine Surface Morphology of Three-Dimensional Cultured Human Skin

Visualization of nanoscale roughness on the skin surface using AFM.

In recent years, the development of alternative methods to animal testing for the efficacy and safety testing of pharmaceuticals and cosmetics has been progressing, with particular attention being paid to testing methods using three-dimensional cultured skin. In this case study, a percutaneous absorption test of a cosmetic (lotion) was conducted using three-dimensional cultured human skin, which was measured using AFM (Atomic Force Microscopy). This allows for a visual evaluation of the microstructure of the skin surface, and it is also possible to quantitatively assess the roughness of any specific area. By measuring under atmospheric conditions, it is possible to observe the samples while minimizing alterations that would occur under vacuum conditions.

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  • Contract Analysis
  • Atomic Force Microscope

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[Analysis Case] Observation of Shape Changes of Polymers on a Substrate Using Liquid AFM Measurements

[Analysis Case] Observation of Shape Changes of Polymers on a Substrate Using Liquid AFM Measurements

Visualization of structural changes in samples in the atmosphere and in aqueous solutions.

Polymers are known to exhibit diverse functions by altering their composition and structure, and they are utilized in various products. In the evaluation of polymers, assessment in real environments is crucial. This time, we will introduce a case where the shape of polymers on a substrate was visualized in the atmosphere and in aqueous solution using an environmental control atomic force microscope (AFM). Additionally, by combining data analysis, we quantified the dispersion of polymer particles.

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[Analysis Case] AFM Analysis of Smartphone Protective Films

[Analysis Case] AFM Analysis of Smartphone Protective Films

Quantitative evaluation of the quality of sensory products is possible.

The penetration rate of smartphones is increasing year by year, and along with that, the protective films applied to their surfaces are diversifying in functionality. In this instance, we will introduce a case where two types of films (A and B) with fingerprint prevention and anti-reflection features were quantitatively evaluated in terms of roughness, simulating the sensation of touch through AFM analysis.

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  • LCD display
  • Atomic Force Microscope

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[Analysis Case] AFM Video Observation of Temporal Changes During Heating and Cooling Processes

[Analysis Case] AFM Video Observation of Temporal Changes During Heating and Cooling Processes

Evaluate the shape change of the sample surface in situ.

Polymers can change shape depending on environmental factors such as temperature, humidity, and solvents, and by varying the environmental conditions during evaluation, we can deepen our understanding of their physical properties. In this study, we conducted heating and cooling experiments using polycaprolactone (PCL), which is known for its biodegradability. PCL has a melting point of approximately 60°C, and we continuously observed through video how it changes from a crystalline state to an amorphous state upon heating, and how it recrystallizes upon cooling. Measurement method: AFM Product fields: Biotechnology, Pharmaceuticals, Daily Goods, Food Analysis purpose: Shape evaluation For more details, please download the materials or contact us.

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[Analysis Case] Dynamic Viscoelastic Evaluation of PDMS using AFM

[Analysis Case] Dynamic Viscoelastic Evaluation of PDMS using AFM

Introduction to the evaluation of in-plane distribution of viscoelasticity and frequency dependence!

Our organization offers dynamic viscoelastic evaluation of PDMS using AFM. Dynamic Mechanical Analysis (DMA) is an effective method for investigating viscoelastic behavior, which is an important factor in the research and development of polymer materials. Additionally, by combining it with the AFM mechanism, it becomes possible to measure in-plane distribution and evaluate localized areas. This document presents a case study using AFM-DMA to map the viscoelastic modulus of PDMS (polydimethylsiloxane) and conduct frequency-dependent spectroscopy evaluation. [Measurement Method / Processing Method] ■ [AFM] Atomic Force Microscopy *For more details, please download the PDF or feel free to contact us.

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  • Contract Analysis
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Atomic Force Microscope 'LiteScope 2.0'

Atomic Force Microscope 'LiteScope 2.0'

Correlation analysis combining SEM and AFM! A deeper understanding of material surfaces.

"LiteScope 2.0" is an atomic force microscope that can be easily integrated with scanning electron microscopes. It can be easily mounted on SEMs and is immediately usable, and it can also be used as a standalone AFM. It is compatible with FIB, GIS, EDS, and other common SEM accessories. 【Features】 ■ Extension of SEM functionality ■ Highly precise correlated imaging ■ Quick and easy alignment to areas of interest ■ Elimination of sample contamination risk ■ Extension of 2D SEM images to 3D *For more details, please refer to the PDF document or feel free to contact us.

  • Electron microscope
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Atomic Force Microscope "Park NX-Wafer"

Atomic Force Microscope "Park NX-Wafer"

Automatic defect inspection function, low noise, high throughput! Introducing an accurate atomic force microscope!

The "Park NX-Wafer" is an atomic force microscope that performs defect imaging and analysis fully automatically, improving productivity in defect inspection by 1,000% through AFM measurement techniques. It is a low-noise atomic force profiler for accurate and high-throughput CMP profile measurements. It measures sub-Å surface roughness with extreme accuracy, minimizing variation between chips. 【Features】 ■ Fully automated AFM solution for defect imaging and analysis ■ Up to 1,000% increase in productivity for defect review ■ Achieves accurate and high-throughput CMP measurements with a low-noise atomic force profiler ■ Extremely accurate sub-Å surface roughness measurement, minimizing variation between chip-to-chip ■ Atomic force profiler *For more details, please refer to the PDF document or feel free to contact us.

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  • Electron microscope
  • Atomic Force Microscope

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AFM platform with optical microscope

AFM platform with optical microscope

Achieves high-speed scanning and high resolution imaging using atomic force microscopy. Compatible with measurements in air and liquid.

This is an AFM platform equipped with an optical microscope. It allows imaging with an atomic force microscope targeting areas observed with the optical microscope. It adopts a vertical optical path design, and the gas-liquid dual-use probe holder can be used simultaneously in both air and liquid. (Liquid measurement option required) *For more details, please contact us.*

  • probe
  • Atomic Force Microscope

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AFM Atomic Force Microscope Nano Observer 2

AFM Atomic Force Microscope Nano Observer 2

Achieving measurement quality comparable to high-end products from established AFM manufacturers.

Combining flexibility, outstanding performance, and user-friendly operability, it achieves measurement quality comparable to high-end products from established AFM manufacturers. It is equipped with a wide range of functions for nanoscale imaging and characterization. It also enables electrical property measurements (KFM, C-AFM) and features a soft IC mode that can measure fragile samples.

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Atomic Force Microscope (AFM)

Atomic Force Microscope (AFM)

Introduction of atomic force microscopes (AFM) capable of proposing customized solutions for various systems, from research use to production sites.

Our company offers a user-friendly atomic force microscope (AFM) that allows for easy and quick measurement of surface shapes. We have a lineup of models including the "CoreAFM," which features an active vibration isolation mechanism and supports a variety of measurement modes, and the compactly designed "NaioAFM," which allows for smooth cantilever replacement using dedicated tools. Customization options are available, ranging from small models for research environments to large stage models for production sites, as well as automated systems for quality control. 【Lineup (excerpt)】 ◎ Desktop Atomic Force Microscope "CoreAFM" 　■ Equipped with active vibration isolation and wind protection 　■ Capable of supporting 32 types of measurement options ◎ Compact Atomic Force Microscope "NaioAFM" 　■ Integrates controller, XY stage, wind protection, and vibration isolation 　■ Equipped with a high-resolution top-view optical camera *We are currently distributing a catalog summarizing the scanning probe microscopes we handle. Detailed information can be viewed via "PDF Download."

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High-performance atomic force microscope DriveAFM

High-performance atomic force microscope DriveAFM

Equipped with the off-resonance measurement mode "WaveMode" using photothermal excitation! Achieves high stability and performance!

"DriveAFM" is a high-performance atomic force microscope that dramatically accelerates research in both material science and life science. It enables high-speed imaging with atomic resolution while covering a very wide scan range of 100μm. It boasts high stability even in liquid environments. With "WaveMode," off-resonance measurements can be performed at speeds over 20 times faster, and the time required for imaging a single field of view is less than one minute. 【Features】 ■ Wide-range and high-resolution scanning using the proprietary "Direct drive" piezo scanner ■ Off-resonance mode "WaveMode" utilizing photothermal excitation developed by Nanosurf ■ WaveMode is useful even for soft samples like polymers ■ Equipped with photothermal excitation for the cantilever called "Clean-Drive" ■ Clearly images the periodic double helix structure of DNA *For more details, please refer to the PDF document or feel free to contact us.

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Compact Type Atomic Force Microscope NaioAFM

Compact Type Atomic Force Microscope NaioAFM

Introducing a low-cost "All-in-one" AFM device that is compact, durable, and easy to operate!

"NaioAFM" is a compact atomic force microscope suitable for users who want to measure surface shapes concisely and quickly in the fields of nanotechnology education at universities and vocational schools, as well as in research and development or quality control. With the product's unique "Flip-over" scan head and dedicated exchange tools, it allows for quick and simple cantilever replacement. Balancing functionality and operability, it is an "All-in-one" AFM device that can be used by anyone, anywhere, and is widely utilized around the world. 【Features】 ■ Integrated controller, XY stage, wind shield, and vibration isolation mechanism ■ Equipped with a high-resolution top-view optical camera for positioning and side-view observation ■ Additional measurement modes can be added according to needs ■ Simple cantilever replacement: no need to adjust the laser or detector ■ Ready for measurement immediately after installation: just connect the USB cable and launch the software *For more details, please refer to the PDF document or feel free to contact us.

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Custom Atomic Force Microscope (AFM) System

Custom Atomic Force Microscope (AFM) System

We will design and build a customized AFM system tailored to your needs!

It is necessary to conduct AFM measurements, but does the sample require special handling due to its size, or does it require experiments that differ from conventional techniques and methods? We sincerely take your needs into consideration and will work together with you to find solutions. At Japan Quantum Design, we design and build systems tailored to your requirements through close collaboration with the device development team at Nanosurf, the manufacturer based in Switzerland. If you have any concerns or requests regarding surface measurements, please feel free to contact us!

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AFM/SPM for Polymers Cypher ES Polymer Edition

AFM/SPM for Polymers Cypher ES Polymer Edition

Standard-equipped with optimal measurement modes and options for polymer material research! Atomic force microscope for polymers based on ultra-high-performance environment-controlled AFM/SPM.

The Cypher ES Polymer Edition is based on the Cypher ES, which adds sophisticated environmental control to Asylum Research's ultra-high-performance AFM, and comes standard with measurement modes and options that are optimal for polymer materials research and polymer characterization (see "Basic Information" below). ● For other features and details, please refer to the catalog or contact us.

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  • Microscope
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Atomic Force Microscope "Handy AFM"

Atomic Force Microscope "Handy AFM"

A super compact AFM with a depth and width that can take you anywhere, both measuring 15 cm.

The atomic force microscope "Handy AFM" can be used as a substitute for high-magnification optical microscopes. It features standard measurement modes, including static force mode, dynamic force mode, phase contrast, phase measurement, force modulation, spreading resistance, and external input capabilities. The scanning head is available in two types: high-resolution and wide-area, and they can be exchanged instantly. Probe replacement takes only a few seconds, and no adjustments are needed after replacement. Additionally, carbon nanotube probes can also be approached automatically. By using an electromagnetic scanner (patented) for scanning, there is no need to move the workpiece during the scan. Generally, it does not exhibit the non-linear creep or aging changes associated with piezo devices commonly used in AFMs. Optionally, it can be combined with a compact automatic stage. For more details, please download the catalog.

  • Electron microscope
  • Atomic Force Microscope

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Atomic Force Microscope "AFM with Stage"

Atomic Force Microscope "AFM with Stage"

The only microscope capable of non-destructive three-dimensional measurement down to the nanometer scale.

The atomic force microscope "AFM with stage" is the only microscope capable of non-destructive three-dimensional measurements down to the nanometer scale in the atmosphere. It allows measurements without damaging the sample. By using an electromagnetic scanner, stable long-term measurements can be achieved without worrying about non-linear creep or aging effects. With a large stage, it is possible to perform non-destructive measurements simply by setting the sample without cutting the workpiece. Various measurement modes are available, providing functions equivalent to expensive AFM devices. Regardless of the material of the measurement work, measurements at the nano level can be performed immediately, from conductors to insulators, without any coating. For more details, please download the catalog.

  • Electron microscope
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Atomic Force Microscopy (AFM) method

Atomic Force Microscopy (AFM) method

Three-dimensional measurement of nanoscale surface roughness.

AFM is a method that scans the surface of a sample with a fine probe and measures nanoscale surface topography in three dimensions. - It can measure a wide range of samples, from insulators to soft organic materials, including metals, semiconductors, and oxides. - By using tapping mode with low contact pressure, it is possible to minimize sample damage.

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[Analysis Case] Observation of Hair Surface Microstructure by AFM

[Analysis Case] Observation of Hair Surface Microstructure by AFM

Quantitative evaluation with reduced alteration is possible through analysis in the atmosphere.

This case study introduces an analysis of the condition of the cuticle on the hair surface using AFM. AFM is a method for three-dimensional measurement of nanoscale surface roughness. Since the analysis is conducted in the atmosphere, it does not cause degradation or gas release of organic materials, allowing for an evaluation of the sample's original shape. In this case study, we assessed the degree of cuticle opening, the distribution of adhered substances, and the roughness evaluation of different areas through images, as well as quantitatively evaluated the surface roughness through numerical processing. This method is effective for evaluating the condition of hair after shampooing and the application state after applying styling products.

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AFM Data Collection

AFM Data Collection

AFM: Atomic Force Microscopy Method

AFM is a method that scans the surface of a sample with a fine probe and measures nano-scale surface topography in three dimensions. It can measure a wide range of materials, not only for the evaluation of metals, semiconductors, and oxides, but also for soft materials such as hair and contact lenses. This document presents various AFM images of different materials.

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  • Wafer
  • Atomic Force Microscope

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[Analysis Case] Evaluation of Surface Roughness of SiC Trench MOSFET Trench Sidewalls

[Analysis Case] Evaluation of Surface Roughness of SiC Trench MOSFET Trench Sidewalls

Quantitative evaluation of the roughness of trench sidewalls related to device characteristics.

In recent years, SiC has been attracting attention as a material for high-voltage devices. The trench MOSFET structure is necessary for the high integration of devices, and the application development for SiC devices is progressing. Since the channel region of the trench MOSFET structure is the trench sidewall, the flatness of the trench sidewall is related to the reliability of the device. This document introduces an example of quantitatively evaluating the roughness of the trench sidewall of SiC trench MOSFETs using AFM (Atomic Force Microscopy).

  • Contract Analysis
  • Other semiconductors
  • Atomic Force Microscope

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[Analysis Case] Evaluation of Mechanical Properties of Food (Roast Ham) by AFM-MA

[Analysis Case] Evaluation of Mechanical Properties of Food (Roast Ham) by AFM-MA

Quantifying texture with mechanical property parameters.

Factors that determine texture include various elements such as hardness and adhesion. Generally, the texture of food is evaluated through stress assessment using tools like texture analyzers, but measuring in micro-regions or thin samples is challenging. AFM-MA can measure not only the shape of surface roughness but also the Young's modulus representing mechanical properties like hardness, adhesion parameters related to texture, and energy dissipation data in micro-regions. Therefore, it is effective for evaluating physical properties related to texture and similar characteristics in extremely small areas.

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  • Contract measurement
  • Atomic Force Microscope

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[Analysis Case] Surface Shape Analysis of GaN Substrates

[Analysis Case] Surface Shape Analysis of GaN Substrates

Visualization of step-terrace structures by AFM.

Gallium nitride (GaN), a wide bandgap semiconductor, is used in a wide range of fields such as power devices and communication/optical devices. When fabricating devices, the shape and roughness of the wafer surface significantly impact device performance. During the growth of GaN wafers, a step-terrace structure is formed on the surface due to stress effects from lattice mismatch with the supporting substrate. This document introduces a case where the step-terrace structure of the GaN substrate surface was visualized using AFM, and the terrace width, step height, surface roughness, and off-angle were evaluated. Measurement method: AFM Product fields: Power devices, electronic components, lighting Analysis purpose: Shape evaluation, structural evaluation For more details, please download the document or contact us.

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  • Contract Analysis
  • Atomic Force Microscope

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